Superseded
Standard
Historical
DIN EN 60749-43:2018-05
Semiconductor devices - Mechanical and climatic test methods - Part 43: Guidelines for IC reliability qualification plans (IEC 60749-43:2017); German version EN 60749-43:2017.
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Summary
This part of DIN EN 60749 gives guidelines for reliability qualification plans of semiconductor integrated circuit products. Categories are set for automotive applications and for general applications as a target of reliability.
Notes
A transition period, as set out in DIN EN IEC 63287-1 (2023-09), exists until 2024-09-29.
Technical characteristics
| Publisher | Deutsche Institut für Normung e.V. (DIN) |
| Publication Date | 05/01/2018 |
| Page Count | 40 |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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