Superseded
Standard
Historical
DIN EN 60749-6:2003-04
Semiconductor devices - Mechanical and climatic test methods - Part 6: Storage at high temperature (IEC 60749-6:2002); German version EN 60749-6:2003.
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Summary
The purpose of this part of DIN EN 60749 is to test and determine the effect on all semiconductor electronic devices of storage at elevated temperature without electrical stress applied. This test is considered non-destructive but should preferably be used for device qualification.
Notes
Under certain conditions, DIN EN 60749 (2002-09) remains valid alongside this standard until 2005-07-01.*A transition period, as set out in DIN EN 60749-6 (2017-11), exists until 2020-04-07.
Technical characteristics
| Publisher | Deutsche Institut für Normung e.V. (DIN) |
| Publication Date | 04/01/2003 |
| Cancellation Date | 11/01/2017 |
| Page Count | 7 |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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