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DIN EN 60749-6:2017-11
Semiconductor devices - Mechanical and climatic test methods - Part 6: Storage at high temperature (IEC 60749-6:2017); German version EN 60749-6:2017.
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Summary
The purpose of this part of DIN EN 60749 is to test and determine the effect on all solid state electronic devices of storage at elevated temperature without electrical stress applied.
Notes
DIN EN 60749-6 (2003-04) remains valid alongside this standard until 2020-04-07.
Technical characteristics
| Publisher | Deutsche Institut für Normung e.V. (DIN) |
| Publication Date | 11/01/2017 |
| Page Count | 9 |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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