DIN EN 60749-9:2003-04
Superseded Standard
Historical

DIN EN 60749-9:2003-04

Semiconductor devices - Mechanical and climatic test methods - Part 9: Permanence of marking (IEC 60749-9:2002); German version EN 60749-9:2002.
Most recent standard

Summary

The purpose of this part of DIN EN 60749 is to test and verify that the markings on semiconductor devices will not become illegible when subject to solvents or cleaning solutions commonly used during the removal of solder flux residue from the printed circuit board assembly process.

Notes

Under certain conditions, DIN EN 60749 (2002-09) remains valid alongside this standard until 2005-07-01.*A transition period, as set out in DIN EN 60749-9 (2017-11), exists until 2020-04-07.

Technical characteristics

Publisher Deutsche Institut für Normung e.V. (DIN)
Publication Date 04/01/2003
Cancellation Date 11/01/2017
Page Count 8
EAN ---
ISBN ---
Weight (in grams) ---
No products.

Previous versions

Contact us