DIN EN 60749-9:2017-11
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DIN EN 60749-9:2017-11

Semiconductor devices - Mechanical and climatic test methods - Part 9: Permanence of marking (IEC 60749-9:2017); German version EN 60749-9:2017.

Summary

The purpose of this part of DIN EN 60749 is to determine whether the marks on solid state semiconductor devices will remain legible when subjected to the application and removal of labels or the use of solvents and cleaning solutions commonly used during the removal of solder flux residue from the printed circuit board manufacturing process.

Notes

DIN EN 60749-9 (2003-04) remains valid alongside this standard until 2020-04-07.

Technical characteristics

Publisher Deutsche Institut für Normung e.V. (DIN)
Publication Date 11/01/2017
Page Count 10
EAN ---
ISBN ---
Weight (in grams) ---
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