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DIN EN 61967-6:2008-10
Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 6: Measurement of conducted emissions - Magnetic probe method (IEC 61967-6:2002 + A1:2008); German version EN 61967-6:2002 + A1:2008.
Summary
This part of IEC 61967 specifies a method for evaluating RF currents on the pins of an integrated circuit (IC) by means of non-contact current measurement using a miniature magnetic probe. This method is capable of measuring the RF currents generated by the IC over the frequency range of 0,15 MHz to 1000 MHz.
Notes
DIN EN 61967-6 (2003-05) remains valid alongside this standard until 2011-04-01.
Technical characteristics
| Publisher | Deutsche Institut für Normung e.V. (DIN) |
| Publication Date | 10/01/2008 |
| Page Count | 48 |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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