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Standard Corrigendum
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DIN EN 61967-6 Berichtigung 1:2011-02
Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 6: Measurement of conducted emissions - Magnetic probe method (IEC 61967-6:2002 + A1:2008); German version EN 61967-6:2002 + A1:2008, Corrigendum to DIN EN 61967-6:2008-10; (IEC-Cor. :2010 to IEC 61967-6:2002)
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Summary
This part of IEC 61967 specifies a method for evaluating RF currents on the pins of an integrated circuit (IC) by means of non-contact current measurement using a miniature magnetic probe. This method is capable of measuring the RF currents generated by the IC over the frequency range of 0,15 MHz to 1000 MHz. The Corrigendum corrects values in figure 3 and Equation A.1
Technical characteristics
| Publisher | Deutsche Institut für Normung e.V. (DIN) |
| Publication Date | 02/01/2011 |
| Page Count | 2 |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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