DIN ISO 24173:2012-01
Superseded Draft standard
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DIN ISO 24173:2012-01

Microbeam analysis - Guidelines for orientation measurement using electron backscatter diffraction (ISO 24713:2009)
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Summary

This Standard gives advice on how to generate reliable and reproducible crystallographic orientation measurements using electron backscatter diffraction (EBSD). It addresses the requirements for specimen preparation, instrument configuration, instrument calibration and data acquisition.

Technical characteristics

Publisher Deutsche Institut für Normung e.V. (DIN)
Publication Date 01/01/2012
Cancellation Date 04/01/2013
Page Count 0
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