DIN ISO 24173:2013-04
Superseded Standard
Historical

DIN ISO 24173:2013-04

Microbeam analysis - Guidelines for orientation measurement using electron backscatter diffraction (ISO 24713:2009)
Most recent standard

Summary

This Standard gives advice on how to generate reliable and reproducible crystallographic orientation measurements using electron backscatter diffraction (EBSD). It addresses the requirements for specimen preparation, instrument configuration, instrument calibration and data acquisition.

Technical characteristics

Publisher Deutsche Institut für Normung e.V. (DIN)
Publication Date 04/01/2013
Page Count 52
EAN ---
ISBN ---
Weight (in grams) ---
No products.

Previous versions

Contact us