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IEC 60749-11:2002/COR1:2003
IEC 60749-11:2002/COR1:2003 Corrigendum 1 - Semiconductor devices - Mechanical and climatic test methods - Part 11: Rapid change of temperature - Two-fluid-bath method
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| Publisher | International Electrotechnical Commission (IEC) |
| Publication Date | 01/30/2003 |
| Edition | 1.0 |
| Page Count | 0 |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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