Active
Standard Corrigendum
Most Recent
IEC 60749-11:2002/COR2:2003
IEC 60749-11:2002/COR2:2003 Corrigendum 2 - Semiconductor devices - Mechanical and climatic test methods - Part 11: Rapid change of temperature - Two-fluid-bath method
Preview
Summary
Modification of the validity date: now put at 2007.
Technical characteristics
| Publisher | International Electrotechnical Commission (IEC) |
| Publication Date | 08/13/2003 |
| Edition | 1.0 |
| Page Count | 0 |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
Modifies
Previous versions
