IEC 60749-23:2004/AMD1:2011
Superseded Standard amendment
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IEC 60749-23:2004/AMD1:2011

IEC 60749-23:2004/AMD1:2011 Amendment 1 - Semiconductor devices - Mechanical and climatic test methods - Part 23: High temperature operating life
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Publisher International Electrotechnical Commission (IEC)
Publication Date 01/27/2011
Edition 1.0
Page Count 5
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ISBN ---
Weight (in grams) ---

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