Superseded
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Standard
Historical
IEC 60749-23:2004
IEC 60749-23:2004 Semiconductor devices - Mechanical and climatic test methods - Part 23: High temperature operating life
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Summary
This test is used to determine the effects of bias conditions and temperature on solid state devices over time. It simulates the device operating condition in an accelerated way, and is primarily used for device qualification and reliability monitoring.
Technical characteristics
| Publisher | International Electrotechnical Commission (IEC) |
| Publication Date | 02/23/2004 |
| Edition | 1.0 |
| Page Count | 17 |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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Previous versions
23/02/2004
Superseded
, Modified
Historical