ISO 24173:2009 (R2015)
Superseded , Reaffirmed Standard
Historical

ISO 24173:2009 (R2015)

Microbeam analysis — Guidelines for orientation measurement using electron backscatter diffraction
Most recent standard

Summary

ISO 24173:2009 gives advice on how to generate reliable and reproducible crystallographic orientation measurements using electron backscatter diffraction (EBSD). It addresses the requirements for specimen preparation, instrument configuration, instrument calibration and data acquisition.

Notes

95.99 : Annulation de la Norme internationale

Technical characteristics

Publisher International Organization for Standardization (ISO)
Publication Date 09/14/2009
Confirmation Date 10/30/2015
Edition 1
Page Count 43
EAN ---
ISBN ---
Weight (in grams) ---
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