ISO 24173:2024
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ISO 24173:2024

Microbeam analysis — Guidelines for orientation measurement using electron backscatter diffraction

Summary

This document gives guidance on how to generate reliable and reproducible crystallographic orientation measurements using electron backscatter diffraction (EBSD). It addresses the requirements for specimen preparation, instrument configuration, instrument calibration and data acquisition.

Notes

60.60 : Norme internationale publiée

Technical characteristics

Publisher International Organization for Standardization (ISO)
Publication Date 02/09/2024
Edition 2
Page Count 40
EAN ---
ISBN ---
Weight (in grams) ---

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