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Standard amendment
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NF EN 60749-19/A1, C96-022-19/A1 (08/2011)
Semiconductor devices - Mechanical and climatic test methods - Part 19 : die shear strength - Dispositifs à semiconducteurs
Summary
Le présent amendement modifie le domaine d.application (ajout d.une note).
Technical characteristics
| Publisher | Association Française de Normalisation (AFNOR) |
| Publication Date | 08/01/2011 |
| Release Date | 08/01/2011 |
| Page Count | 7 |
| Themes | Electrotechnologies |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |