UNE-EN 60749-19:2003/A1:2011
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UNE-EN 60749-19:2003/A1:2011

Semiconductor devices - Mechanical and climatic test methods -- Part 19: Die shear strength
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Publisher Asociacion Espanola de Normalizacion y Certificacion (AENOR)
Publication Date 01/19/2011
Page Count 8
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ISBN ---
Weight (in grams) ---

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