UNE-EN 60749-19:2003
Active , Modified Standard
Most Recent

UNE-EN 60749-19:2003

Semiconductor devices - Mechanical and climatic test methods -- Part 19: Die shear strength
Base standard
Most recent standard
No description.

Technical characteristics

Publisher Asociacion Espanola de Normalizacion y Certificacion (AENOR)
Publication Date 11/21/2003
Page Count 8
EAN ---
ISBN ---
Weight (in grams) ---

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