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UNE-EN 60749-2:2003
Semiconductor devices - Mechanical and climatic test methods -- Part 2: Low air pressure.
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| Publisher | Asociacion Espanola de Normalizacion y Certificacion (AENOR) |
| Publication Date | 05/30/2003 |
| Page Count | 10 |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
Replaces
28/11/2002
Superseded
Historical
23/10/2001
Superseded
Historical
15/11/2000
Superseded
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30/05/2003
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