Superseded
Standard
Historical
UNE-EN 60749-3:2003
Semiconductor devices - Mechanical and climatic test methods - Part 3: External visual examination
Preview
No description.
Technical characteristics
| Publisher | Asociacion Espanola de Normalizacion y Certificacion (AENOR) |
| Publication Date | 05/30/2003 |
| Cancellation Date | 04/08/2020 |
| Page Count | 8 |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
Replaces
28/11/2002
Superseded
Historical
23/10/2001
Superseded
Historical
15/11/2000
Superseded
Historical
Previous versions
30/05/2003
Superseded
Historical