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VDI/VDE 2655 Blatt 1.1:2024-01
Optical measurement and microtopographies - Calibration of interference microscopes and depth measurement standards for roughness measurement
Summary
Optische Messtechnik an Mikrotopografien - Kalibrieren von Interferenzmikroskopen und Tiefeneinstellnormalen für die Rauheitsmessung
Technical characteristics
| Publisher | Verein Deutscher Ingenieure e.V. (VDI) |
| Publication Date | 01/01/2024 |
| Page Count | 8 |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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Previous versions
01/03/2008
Superseded
, Reaffirmed
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