Semiconductor devices - Micro-electromechanical devices - Part 22: Electromechanical tensile test method for conductive thin films on flexible substrates (IEC 62047-22:2014); German version EN 62047-22:2014
€77.20
Semiconductor devices - Mechanical and climatic test methods - Part 42: Temperature and humidity storage (IEC 60749-42:2014); German version EN 60749-42:2014
€63.27
Electronic components - Long-term storage of electronic semiconductor devices - Part 7 : micro-electromechanical devices - Stockage de longue durée des composants électroniques - Partie 7 : Dispositifs microélectromécaniques
€111.67
Technologies et dispositifs électroniques prêt-à-porter - Partie 401-1 : dispositifs et systèmes : éléments de fonctionnement - Méthode d'évaluation de la jauge de contrainte extensible de type résistifAutomatic translation from French : Wearable electronic technologies and devices - Part 401-1: devices and systems: operating elements - Method for evaluating the resistive-type expandable strain gauge
Semiconductor devices - Mechanical and climatic test methods - Part 44 : neutron beam irradiated single event effect (SEE) test method for semiconductor devices
Semiconductor devices - Mechanical and climatic test methods - Part 3 : external visual examination
€77.67
Semiconductor devices - Mechanical and climatic test methods - Part 4 : Damp Heat, steady state, highly accelerated stress test (HAST)
Semiconductor devices - Mechanical and climatic test methods - Part 6 : storage at high temperature
€59.33
Semiconductor devices - Mechanical and climatic test methods - Part 9 : permanence of marking
Normalisation mécanique des dispositifs à semi-conducteurs - Partie 1 : règles générales pour la préparation des dessins d'encombrement des dispositifs discrets
€131.33
Semiconductor devices - Mechanical and climatic test methods - Part 12 : vibration, variable frequency
Semiconductor devices - Mechanical and climatic test methods - Part 13 : salt atmosphere
€95.67
Semiconductor devices; sectional specification for semiconductor devices; identical with IEC 60747-11:1985
Semiconductor devices - Mechanical and climatic test methods - Part 27 : electrostatic discharge (ESD) sensivity testing - Machine model (MM) - Dispositifs à semiconducteurs
€43.67
Obsolescence electronic components - Rules concerning the treatment of product discontinuance and replacement - Obsolescence des composants électroniques
