Impregnated-asbestos-covered copper solid conductors.
€269.00
Pin 1 mark for identification in automatic handling systems (IEC 47D/53/CD:1994)
€41.78
Semiconductor devices - Requirements for resistance to dissolution of metallization on surface mounting (SMD) (IEC 47/1390/CD:1995)
€48.79
Semiconductor devices; concepts for element of semiconductor devices and other related concepts; identical with IEC 47(Central Office)1223
€34.30
Semiconductor devices; concepts and letter symbols for direct and alternating quantities; identical with IEC 47(Central Office)1224
Semiconductor devices; mechanical and climatic test method; internal moisture content measurement by mass spectrometry method; identical with IEC 47(Central Office)1252
Semiconductor devices; basic concepts defining the scope of TC 47; identical with IEC 47(Central Office)1220
Semiconductor devices; terms and definitions for semiconductor pressure sensors; identical with IEC 47(Secretariat)1253
€77.20
Electrostatic sensitive semiconductor devices sensitive to voltage pulses of short duration; test methods; identical with IEC 47(Central Office)1246
Semiconductor devices; new and revised terms and definitions; identical with IEC 47/1(IEV 521)(Central Office)1253/1320
Semiconductor devices; resistance of semiconductor SMDs to the combined effect of moisture and soldering heat; identical with IEC 47(Central Office)1316
Semiconductor devices; list of recommended subscripts in IEC 60747-1, partial revision; identical with IEC 47(Secretariat)1284
€56.17
Semiconductor devices; pulse concepts and input-to-output pulse switching times; identical with IEC 47(Central Office)1315:1992
Semiconductor devices; assessment of quality levels in PPM; identical with IEC 47(Central Office)1338:1992
Semiconductor devices; amendment to IEC 60747-11: sectional specification for discrete semiconductor devices (IEC 47(Secretariat)1318:1993)
