Semiconductor devices; protections of electrostatic-sensitive devices (IEC 47(Secretariat)1330:1993)
€105.42
Semiconductor devices; amendments of the rules for subscripts and indication of polarity (IEC 47(Central Office)1336:1992)
€34.30
Semiconductor devices - Visual inspection of discrete semiconductor devices (IEC 47E(Secretariat)6:1994)
€214.30
Semiconductor devices and integrated circuits; terms and definitions; amendments and supplements to IEC 60747-1 and IEC 60747-7; identical with IEC 47(Central Office)981
Harmonized system of quality assessment for electronic components: Discrete semiconductor devices
€122.34
Semiconductor devices - Discrete devices and integrated circuits - Thyristors; Identical with CEI 747-6, edition 1983
€167.66
Semiconductor devices; mechanical and climatic test methods; identical with IEC 60749, edition 1984
€84.58
Semiconductor devices; terminology; electrostatic-discharge-sensitive; identical with IEC 47(Central Office)1052
Semiconductor devices; recovered charge; terminology; identical with IEC 47(Central Office)1077
Semiconductor devices; term and letter symbol for leakage current; identical with IEC 47(Central Office)1073
Microelectromechanical devices - Part 2: Tensile testing method of thin film materials (IEC 47/1759/CD:2004)
€69.91
Microelectromechanical devices - Part 3: Thin film standard test piece (IEC 47/1760/CD:2004)
€41.78
Semiconductor devices - Mechanical and climatic test methods - Part 34: Power cycling (IEC 60749-34:2004); German version EN 60749-34:2004.
Time Dependent Dielectric Breakdown Test (TDDB) (IEC 47/1764/CD:2004)
€91.03
Semiconductor devices - Mechanical and climatic test methods - Part 35: Acoustic microscopy for non-hermetic encapsulated electronic components (IEC 47/1769/CD:2004)
€98.32
