Semiconductor devices Optoelectronic devices. Light emitting diodes. Test method of the surface temperature based on thermoreflectance
€269.00
Semiconductor devices. Micro-electromechanical devices Silicon based MEMS fabrication technology. Measurement method of bending strength microstructures
€193.00
Semiconductor devices Magnetic and capacitive coupler for basic reinforced insulation
Semiconductor devices. Micro-electromechanical devices Terms and definitions
Semiconductor die products Exchange data formats
€374.00
Semiconductor devices Microwave integrated circuits. Phase shifters
€316.00
BS EN IEC 62047-51 Semiconductor Devices - Micro-electromechanical Part 51: Test method of electrical characteristics under two-directional cyclic bending deformation for flexible microelectromechanical devices
€23.00
Semiconductor devices Discrete devices. Isolated power semiconductor
BS EN IEC 60747-5-19 Semiconductor devices Part 5-19: Optoelectronic - Light emitting diodes Test method of the micro photoluminescence for chip wafers light
BS IEC 63581-1 Semiconductor devices - The recognition criteria of defects in polished indium phosphide wafers Part 1: Classification
BS EN IEC 63601 Guideline for Evaluating Bias Temperature Instability of Silicon Carbide Metal-Oxide-Semiconductor Devices for Power Electronic Conversion (Fast track)
BS EN IEC 63602 Guidelines for Representing Switching Losses of SIC MOSFETs in Datasheets (Fast track)
BS EN IEC 63550-1 Semiconductor devices - Neuromorphic Part 1: Evaluation method of basic characteristics in memristor
BS EN IEC 63550-2 Semiconductor devices - Neuromorphic Part 2: Evaluation method of linearity in memristor
BS EN IEC 63550-4 Semiconductor devices. Neuromorphic devices Evaluation method of asymmetry in neuromorphic memristor
