31.080.99 : Other semiconductor devices

22/30430766 DC:2022

22/30430766 DC:2022

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BS EN 60947-10. Low-voltage switchgear and controlgear Part 10. Semiconductor Circuit-Breakers

€42.00

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BS IEC 60747-18-4:2023

BS IEC 60747-18-4:2023

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Semiconductor devices bio sensors. Evaluation method of noise characteristics lens-free CMOS photonic array sensors

€193.00

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BS IEC 60747-18-5:2023

BS IEC 60747-18-5:2023

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Semiconductor devices bio sensors. Evaluation method for light responsivity characteristics of lens-free CMOS photonic array sensor package modules by incident angle

€193.00

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BS IEC 62047-42:2022

BS IEC 62047-42:2022

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Semiconductor devices. Micro-electromechanical devices Measurement methods of electro-mechanical conversion characteristics piezoelectric MEMS cantilever

€269.00

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BS EN IEC 63364-1:2022

BS EN IEC 63364-1:2022

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Semiconductor devices. devices for IoT system Test method of sound variation detection

€193.00

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BS EN IEC 60747-17:2020

BS EN IEC 60747-17:2020

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Semiconductor devices Magnetic and capacitive coupler for basic reinforced insulation

€374.00

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BS EN IEC 63373:2022

BS EN IEC 63373:2022

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Dynamic on-resistance test method guidelines for GaN HEMT based power conversion devices

€193.00

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22/30437195 DC:2022

22/30437195 DC:2022

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BS IEC 62047-43. Semiconductor devices. Micro-electromechanical devices Part 43. Test method of electrical characteristics after cyclic bending deformation for flexible electro-mechanical

€23.00

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BS IEC 62047-43:2024

BS IEC 62047-43:2024

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Semiconductor devices. Micro-electromechanical devices Test method of electrical characteristics after cyclic bending deformation for flexible micro-electromechanical

€193.00

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BS EN IEC 62031:2020+A11:2021

BS EN IEC 62031:2020+A11:2021

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LED modules for general lighting. Safety specifications

€269.00

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21/30439037 DC:2021

21/30439037 DC:2021

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BS IEC 63150-2. Semiconductor devices. Measurement and evaluation methods of kinetic energy harvesting devices under practical vibration environment Part 2. Human arm swing motion

€23.00

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BS IEC 63068-4:2022

BS IEC 63068-4:2022

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Semiconductor devices. Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power devices Procedure identifying and evaluating using a combined method optical inspection photoluminescence

€269.00

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24/30497109 DC:2024

24/30497109 DC:2024

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BS EN IEC 63068-5 Semiconductor devices. Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power devices Part 5. Test method using X-ray topography

€23.00

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24/30497113 DC:2024

24/30497113 DC:2024

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BS EN IEC 63567-1 Semiconductor devices. Performance evaluation of semiconductor processing components and inspection equipment Part 1. Transmittance method EUV pellicle

€23.00

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24/30497861 DC:2024

24/30497861 DC:2024

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BS EN IEC 63551-1. Semiconductor devices. Detection modules of autonomous land vehicle Part 1. Testing methods detection performance for LiDAR

€23.00

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