BS EN IEC 60747-5-13/AMD1 Amendment 1 - Semiconductor devices Part 5-13: Optoelectronic Hydrogen sulphide corrosion test for LED packages
€23.00
Semiconductor devices. Micro-electromechanical devices Silicon based MEMS fabrication technology. Measurement method of impact resistance nanostructures
€193.00
Semiconductor devices. Micro-electromechanical devices Silicon based MEMS fabrication technology. Measurement method of tensile strength nanoscale thickness membrane
Semiconductor devices. Estimation method for lifetime conversion from “PART” to “SYSTEM”
€269.00
Semiconductor devices. Micro-electromechanical devices MEMS electrothermal transfer device
Semiconductor devices. Measurement and evaluation methods of kinetic energy harvesting devices under practical vibration environment Human arm swing motion
Semiconductor devices. Measurement and evaluation methods of kinetic energy harvesting devices under practical vibration environment Human foot impact motion
Semiconductor devices. Micro-electromechanical devices Temperature and humidity test methods for piezoelectric MEMS cantilevers
€165.00
BS EN IEC 62047-57 Micro-electromechanical systems Part 57: RF MEMS directional coupler
Semiconductor devices Optoelectronic devices. Hydrogen sulphide corrosion test for LED packages
Guideline for evaluating bias temperature instability of silicon carbide metal-oxide-semiconductor devices for power electronic conversion
€355.00
Semiconductor devices. Discrete devices Isolated power semiconductor
Guidelines for representing switching losses of SIC MOSFETs in datasheets
BS EN IEC 62047-58 Semiconductor devices - Micro-electromechanical systems Part 58: Test methods for performances of MEMS thermopile
