Semiconductor die products XML schema for data exchange
€269.00
Varnishes used for electrical insulation Methods of test
Semiconductor devices. Micro-electromechanical devices Axial fatigue testing methods of thin film materials
€193.00
Semiconductor die products Procurement and use
€355.00
Semiconductor die products EXPRESS model schema for data exchange
Semiconductor devices. Micro-electromechanical devices Micro-pillar compression test for MEMS materials
Semiconductor devices. Micro-electromechanical devices Test method for coefficients of linear thermal expansion free-standing materials micro-electromechanical systems
Semiconductor devices. Micro-electromechanical devices Bend-and shear-type test methods of measuring adhesive strength for MEMS structures
Semiconductor devices. Micro-electromechanical devices Test method of bonding strength between PDMS and glass
Hand-held motor-operated electric tools. Safety General requirements
€404.00
Semiconductor devices. Micro-electromechanical devices Tensile testing method of thin film materials
Integrated circuits. Measurement of electromagnetic emissions, 150 kHz to 1 GHz radiated emissions. TEM cell and wideband method
Semiconductor devices. Time dependent dielectric breakdown (TDDB) test for gate dielectric films
Semiconductor devices. Micro-electromechanical devices Thin film standard test piece for tensile testing
€165.00
Automatic electrical controls for household and similar use General requirements
