31.080.99 : Other semiconductor devices

BS EN 62047-8:2011

BS EN 62047-8:2011

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Semiconductor devices. Micro-electromechanical devices Strip bending test method for tensile property measurement of thin films

€193.00

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PD CLC/TR 62258-3:2007

PD CLC/TR 62258-3:2007

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Semiconductor die products Recommendations for good practice in handling, packing and storage

€355.00

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BS EN 62258-2:2011

BS EN 62258-2:2011

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Semiconductor die products Exchange data formats

€404.00

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BS IEC 60747-14-3:2009

BS IEC 60747-14-3:2009

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Semiconductor devices sensors. Pressure sensors

€269.00

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BS EN 62384:2006+A1:2009

BS EN 62384:2006+A1:2009

Superseded Historical

DC or AC supplied electronic control gear for LED modules. Performance requirements

€193.00

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BS EN 60904-4:2009

BS EN 60904-4:2009

Superseded Historical

Photovoltaic devices Reference solar devices. Procedures for establishing calibration traceability

€269.00

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BS IEC 60747-14-2:2000

BS IEC 60747-14-2:2000

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Discrete semiconductor devices and integrated circuits. Semiconductor devices. sensors Hall elements

€193.00

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BS EN 60512-2-6:2002

BS EN 60512-2-6:2002

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Connectors for electronic equipment. Tests and measurements. Electrical continuity contact resistance tests Test 2f. Housing (shell) electrical

€165.00

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BS EN 60146-2:2000

BS EN 60146-2:2000

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Semiconductor convertors. General requirements and line commutated convertors Self-commutated semiconductor converters including direct d.c.

€355.00

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BS EN 60747-5-2:2001

BS EN 60747-5-2:2001

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Discrete semiconductor devices and integrated circuits. Optoelectronic Essential ratings characteristics

€316.00

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BS EN 60747-5-3:2001

BS EN 60747-5-3:2001

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Discrete semiconductor devices and integrated circuits. Optoelectronic Measuring methods

€355.00

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BS CECC 50000:Supplement No. 1:1983

BS CECC 50000:Supplement No. 1:1983

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Harmonized system of quality assessment for electronic components. Generic specification: discrete semiconductor devices. CECC assessed process average

€165.00

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BS EN 61223-3-1:1999

BS EN 61223-3-1:1999

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Evaluation and routine testing in medical imaging departments Acceptance tests Imaging performance of X-ray equipment for radiographic radiscopic systems

€374.00

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BS CECC 50000:1987

BS CECC 50000:1987

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Harmonized system of quality assessment for electronic components. Generic specification: discrete semiconductor devices

€404.00

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BS EN 62047-4:2010

BS EN 62047-4:2010

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Semiconductor devices. Micro-electromechanical devices Generic specification for MEMS

€269.00

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