Semiconductor devices. Mechanical and climatic test methods Neutron irradiation
€165.00
Semiconductor devices. Mechanical and climatic test methods Ionizing radiation (total dose)
€193.00
Specification for safety of household and similar electrical appliances Particular requirements tumble dryers
Board level drop test method of components for handheld electronicproduc ts
Semiconductor die products Questionnaire for users and suppliers
Semiconductor devices. Mechanical and climatic test methods Electrostatic discharge (ESD) sensitivity testing. Human body model (HBM)
Mechanical standardization of semiconductor devices General rules for the preparation outline drawings discrete
€316.00
Mechanical standardization of semiconductor devices Design guideline open-top-type sockets for fine-pitch ball grid array and land (FBGA/FLGA)
Environmental testing. Test methods Db and guidance: damp heat, cyclic (12 + 12 hour cycle)
Discrete semiconductor devices and integrated circuits. Semiconductor devices. sensors General classification Sensor generals for
Semiconductor devices. Mechanical and climatic test methods Steady-state temperature humidity bias life
Data requirements for semiconductor die. Exchange data formats and dictionary exchange. DDX file format
Data requirements for semiconductor die. Specific and recommendations Electrical simulation
Data requirements for semiconductor die. Specific and recommendations Thermal
Data requirements for semiconductor die. Specific and recommendations Handling storage
