DIN IEC 48B/833/CD:2000-04

DIN IEC 48B/833/CD:2000-04

Superseded Historical

Electromechanical components for electronic equipment - Basic testing procedures and measuring methods - Part 5-1: Current-carrying capacity tests; test 5a: Temperature rise (IEC 48B/833/CD:1999)

€34.30

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DIN IEC 48B/834/CD:2000-04

DIN IEC 48B/834/CD:2000-04

Superseded Historical

Electromechanical components for electronic equipment - Basic testing procedures and measuring methods - Part 5-2: Current-carrying capacity tests; test 5b: Current temperature derating (IEC 48B/834/CD:1999)

€41.78

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DIN IEC 48B/835/CD:2000-04

DIN IEC 48B/835/CD:2000-04

Superseded Historical

Electromechanical components for electronic equipment - Basic testing procedures and measuring methods - Part 6-1: Dynamic stress tests; test 6a: Acceleration, steady state (IEC 48B/835/CD:1999)

€41.78

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DIN IEC 48B/836/CD:2000-04

DIN IEC 48B/836/CD:2000-04

Superseded Historical

Electromechanical components for electronic equipment - Basic testing procedures and measuring methods - Part 6-2: Dynamic stress tests; test 6b: Bump (IEC 48B/836/CD:1999)

€34.30

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DIN IEC 48B/837/CD:2000-04

DIN IEC 48B/837/CD:2000-04

Superseded Historical

Electromechanical components for electronic equipment - Basic testing procedures and measuring methods - Part 6-2: Dynamic stress tests; test 6c: Shock (IEC 48B/837/CD:1999)

€41.78

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DIN IEC 48B/838/CD:2000-04

DIN IEC 48B/838/CD:2000-04

Superseded Historical

Electromechanical components for electronic equipment - Basic testing procedures and measuring methods - Part 6-4: Dynamic stress tests; test 6d: Vibration (sinusoidal) (IEC 48B/838/CD:1999)

€41.78

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DIN IEC 48B/845/CD:2000-04

DIN IEC 48B/845/CD:2000-04

Superseded Historical

Electromechanical components for electronic equipment - Basic testing procedures and measuring methods - Part 11-10: Climatic tests; test 11j: Cold (IEC 48B/845/CD:1999)

€48.79

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DIN IEC 62047-6:2007-07

DIN IEC 62047-6:2007-07

Superseded Historical

Semiconductor devices - Micro-electromechanical devices - Part 6: Axial fatigue testing methods of thin film materials (IEC 47/1900/CD:2007)

€91.03

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DIN IEC 62047-5:2008-02

DIN IEC 62047-5:2008-02

Superseded Historical

Semiconductor devices - Micro-electromechanical devices - Part 5: RF MEMS Switches (IEC 47/1928/CD:2007)

€116.64

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DIN IEC 62047-9:2008-03

DIN IEC 62047-9:2008-03

Superseded Historical

Semiconductor devices - Micro-electromechanical devices - Part 9: Wafer to wafer bonding strength measurement for MEMS (IEC 47/1947/CD:2007)

€98.32

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DIN IEC 62047-1:2003-10

DIN IEC 62047-1:2003-10

Superseded Historical

Semiconductor devices - Part 1: Microelectromechanical devices; Terms and definitions (IEC 47/1695A/CD:2003)

€98.32

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DIN 41640-26:1982-06

DIN 41640-26:1982-06

Superseded Historical

Measuring methods and testing procedures for electromechanical components; test 11b: combined/sequential cold, low air pressure and damp heat

€34.30

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DIN 41722:1974-07

DIN 41722:1974-07

Withdrawn Most Recent

Star indicators 15 mm dia with automatic; principal dimensions and electrical datas

€24.39

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DIN 41640-9:1976-12

DIN 41640-9:1976-12

Superseded Historical

Measurements and test methods for electromechanical components; test 4b: partial discharge

€24.39

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DIN 41640-31:1979-03

DIN 41640-31:1979-03

Superseded Historical

Measuring methods and testing procedures for electromechanical components; test 11i: dry heat

€24.39

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