Microelectromechanical devices - Part 2: Tensile testing method of thin film materials (IEC 47/1759/CD:2004)
€69.91
Microelectromechanical devices - Part 3: Thin film standard test piece (IEC 47/1760/CD:2004)
€41.78
Semiconductor devices - Micro-electromechanical devices - Part 12: A method for fatigue testing thin film materials using the resonant vibration of a MEMS structure (IEC 47F/43/CD:2010)
€111.40
Semiconductor devices - Micro-electromechanical devices - Part 10: Micropillar compression test for MEMS materials (IEC 47F/48/CD:2010)
Semiconductor devices - Micro electro mechanical devices - Part 13: Bend- and shear- test methods of measuring adhesive strength for MEMS structures (IEC 47F/44/CD:2010)
Semiconductor devices - Micro-electromechanical devices - Part 14: Forming limit measuring method of metallic film materials (IEC 47F/59/CD:2010)
€98.32
Technical documentation for the assessment of electrical and electronic products with respect to the restriction of hazardous substances
€63.27
Semiconductor devices - Micro-electromechanical devices - Part 7: MEMS FBAR Filter & Duplexer (IEC 47/1969/CD:2008)
Electromechanical components for electronic equipment - Basic testing procedures and measuring methods - Part 1-1: General examination; Test 1a: Visual examination (IEC 48B/822/CD:1999)
Electromechanical components for electronic equipment - Basic testing procedures and measuring methods - Part 1-2: General examination; Test 1b: Examination of dimension and mass (IEC 48B/823/CD:1999)
Electromechanical components for electronic equipment - Basic testing procedures and measuring methods - Part 2-1: Electrical continuity and contact resistance tests; Test 2a: Contact resistance, Millivolt level method (IEC 48B/824/CD:1999)
Electromechanical components for electronic equipment - Basic testing procedures and measuring methods - Part 2-2: Electrical continuity and contact resistance test; Test 2b: Contact resistance, specified test current method (IEC 48B/825/CD:1999)
Electromechanical components for electronic equipment - Basic testing procedures and measuring methods - Part 2-3: Electrical continuity and contact resistance tests; Test 2c: Contact resistance variation (IEC 48B/826/CD:1999)
Electromechanical components for electronic equipment - Basic testing procedures and measuring methods - Part 2-5: Electrical continuity and contact resistance tests; Test 2e: Contact disturbance (IEC 48B/827/CD:1999)
€34.30
Electromechanical components for electronic equipment - Basic testing procedures and measuring methods - Part 2-6: Electrical continuity and contact resistance tests; Tests 2f: Housing (shell) electrical continuity (IEC 48B/828/CD:1999)
