71.040.40 : Chemical analysis

NBN ISO 23124:2024

NBN ISO 23124:2024

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Surface chemical analysis — Measurement of lateral and axial resolutions of a Raman microscope

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ISO 6227:1982 (R2021)

ISO 6227:1982 (R2021)

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Chemical products for industrial use — General method for determination of chloride ions — Potentiometric method

€77.00

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ISO 6228:1980 (R2022)

ISO 6228:1980 (R2022)

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Chemical products for industrial use — General method for determination of traces of sulphur compounds, as sulphate, by reduction and titrimetry

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ISO 8213:1986 (R2023)

ISO 8213:1986 (R2023)

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Chemical products for industrial use — Sampling techniques — Solid chemical products in the form of particles varying from powders to coarse lumps

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ISO 14976:1998 (R2022)

ISO 14976:1998 (R2022)

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Surface chemical analysis — Data transfer format

€208.00

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ISO 14975:2000 (R2022)

ISO 14975:2000 (R2022)

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Surface chemical analysis — Information formats

€115.00

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ISO 6143:2001 (R2017)

ISO 6143:2001 (R2017)

Superseded Historical

Gas analysis — Comparison methods for determining and checking the composition of calibration gas mixtures

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ISO 6144:2003 (R2024)

ISO 6144:2003 (R2024)

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Gas analysis — Preparation of calibration gas mixtures — Static volumetric method

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ISO 14912:2003 (R2021)

ISO 14912:2003 (R2021)

Superseded Historical

Gas analysis — Conversion of gas mixture composition data

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ISO/TR 15969:2001 (R2018)

ISO/TR 15969:2001 (R2018)

Superseded Historical

Surface chemical analysis — Depth profiling — Measurement of sputtered depth

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ISO 18116:2005 (R2019)

ISO 18116:2005 (R2019)

Superseded Historical

Surface chemical analysis — Guidelines for preparation and mounting of specimens for analysis

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ISO 16242:2011 (R2024)

ISO 16242:2011 (R2024)

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Surface chemical analysis — Recording and reporting data in Auger electron spectroscopy (AES)

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ISO 16243:2011 (R2024)

ISO 16243:2011 (R2024)

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Surface chemical analysis — Recording and reporting data in X-ray photoelectron spectroscopy (XPS)

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ISO 17974:2002 (R2021)

ISO 17974:2002 (R2021)

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Surface chemical analysis — High-resolution Auger electron spectrometers — Calibration of energy scales for elemental and chemical-state analysis

€183.00

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ISO 18114:2003 (R2014)

ISO 18114:2003 (R2014)

Superseded Historical

Surface chemical analysis — Secondary-ion mass spectrometry — Determination of relative sensitivity factors from ion-implanted reference materials

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