Surface chemical analysis — Analysis of metal oxide films by glow-discharge optical-emission spectrometry
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Evaluation of thickness, density and interface width of thin films by X-ray reflectometry — Instrumental requirements, alignment and positioning, data collection, data analysis and reporting
€183.00
Surface chemical analysis — scanning probe microscopy — Guideline for experimental quantification of carrier concentration in semiconductor devices by using electric scanning probe microscopy
Surface chemical analysis — Depth profiling — Methods for ion beam alignment and the associated measurement of current or current density for depth profiling in AES and XPS
€155.00
Surface chemical analysis — Analysis of metallic nanolayers on iron based substrates by glow-discharge optical-emission spectrometry
Surface chemical analysis — Determination of the minimum detectability of surface plasmon resonance device
€77.00
Surface chemical analysis — Secondary-ion mass spectrometry — Method for depth profiling of arsenic in silicon
€115.00
Surface chemical analysis — Scanning probe microscopy — Standards on the definition and calibration of spatial resolution of electrical scanning probe microscopes (ESPMs) such as SSRM and SCM for 2D-dopant imaging and other purposes
Surface Chemical Analysis — Atomic force microscopy — Procedure for in situ characterization of AFM probe shank profile used for nanostructure measurement
Gas analysis — Vocabulary
Gas analysis — Contents of certificates for calibration gas mixtures
Surface chemical analysis — X-ray photoelectron spectroscopy — Reporting of results of thin-film analysis
€208.00
Surface chemical analysis — Fundamental approaches to determination of lateral resolution and sharpness in beam-based methods
€261.00
Surface chemical analysis — Characterization of nanostructured materials
Surface chemical analysis — X-ray photoelectron spectrometers — Calibration of energy scales
