Surface chemical analysis — Auger electron spectroscopy — Derivation of chemical information
€155.00
Surface chemical analysis — Secondary-ion mass spectrometry — Method for depth profiling of boron in silicon
€77.00
Surface chemical analysis — X-ray photoelectron spectroscopy — Estimating and reporting detection limits for elements in homogeneous materials
Surface chemical analysis — Characterization of functional glass substrates for biosensing applications
€183.00
Surface chemical analysis — Electron spectroscopies — Minimum reporting requirements for peak fitting in X-ray photoelectron spectroscopy
Surface chemical analysis — Analysis of zinc- and/or aluminium-based metallic coatings by glow-discharge optical-emission spectrometry
€208.00
Surface chemical analysis — Auger electron spectroscopy and X-ray photoelectron spectroscopy — Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials
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Surface chemical analysis — Total reflection X-ray fluorescence analysis of water
Surface chemical analysis — Scanning-probe microscopy — Determination of geometric quantities using SPM: Calibration of measuring systems
€235.00
Surface chemical analysis — Secondary ion mass spectrometry — Correction method for saturated intensity in single ion counting dynamic secondary ion mass spectrometry
€115.00
Gas analysis — General quality aspects and metrological traceability of calibration gas mixtures
Surface chemical analysis — Scanning probe microscopy — Procedure for the determination of elastic moduli for compliant materials using atomic force microscope and the two-point JKR method
Surface chemical analysis — Glow discharge mass spectrometry — Operating procedures
Gas analysis — Handling of calibration gases and gas mixtures — Guidelines
Surface chemical analysis — Medium-resolution Auger electron spectrometers — Calibration of energy scales for elemental analysis
