Surface chemical analysis — Auger electron spectroscopy — Description of selected instrumental performance parameters
€51.00
Surface chemical analysis — X-ray photoelectron spectroscopy — Description of selected instrumental performance parameters
Gas analysis — Purity analysis and the treatment of purity data
€115.00
Surface chemical analysis — Secondary ion mass spectrometry — Calibration of the mass scale for a time-of-flight secondary ion mass spectrometer
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Surface chemical analysis — Secondary ion mass spectrometry — Method for determining yield volume in argon cluster sputter depth profiling of organic materials
€183.00
Surface chemical analysis — Near real-time information from the X-ray photoelectron spectroscopy survey scan — Rules for identification of, and correction for, surface contamination by carbon-containing compounds
Surface chemical analysis — Secondary ion mass spectrometry — Method for the measurement of mass resolution in SIMS
Surface chemical analysis — X-ray photoelectron spectroscopy — Guidelines for analysis
Surface chemical analysis — Measurement of lateral and axial resolutions of a Raman microscope
€77.00
Surface chemical analysis — Depth profiling — Non-destructive depth profiling of nanoscale heavy metal oxide thin films on Si substrates with medium energy ion scattering
Surface chemical analysis — Auger electron spectroscopy and X-ray photoelectron spectroscopy — Methods used to determine peak intensities and information required when reporting results
Surface chemical analysis — X-ray photoelectron spectroscopy — Measurement of silicon oxide thickness
Surface chemical analysis — X-ray photoelectron spectroscopy — Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
Surface chemical analysis — Characterization of nanostructured materials
€208.00
Surface chemical analysis — X-ray photoelectron spectroscopy — Procedures for determining backgrounds
