DIN EN 60749-29:2002-09
Superseded Draft standard
Historical

DIN EN 60749-29:2002-09

Semiconductor devices - Mechanical and climatic test methods - Part 29: Latch-up test (IEC 47/1625/CDV:2002); German version prEN 60749-29:2002
Most recent standard

Summary

Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 29: Latch-up-Prüfung (IEC 47/1625/CDV:2002); Deutsche Fassung prEN 60749-29:2002

Technical characteristics

Publisher Deutsche Institut für Normung e.V. (DIN)
Publication Date 09/01/2002
Page Count 8
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ISBN ---
Weight (in grams) ---
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