Superseded
Draft standard
Historical
DIN EN 60749-29:2009-11
Semiconductor devices - Mechanical and climatic test methods - Part 29: Latch-up test (IEC 47/2026/CDV:2009); German version FprEN 60749-29:2009
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Summary
Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 29: Latch-up-Prüfung (IEC 47/2026/CDV:2009); Deutsche Fassung FprEN 60749-29:2009
Technical characteristics
| Publisher | Deutsche Institut für Normung e.V. (DIN) |
| Publication Date | 11/01/2009 |
| Page Count | 8 |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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