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DIN EN 60749-29:2012-01
Semiconductor devices - Mechanical and climatic test methods - Part 29: Latch-up test (IEC 60749-29:2011); German version EN 60749-29:2011.
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Summary
This part of DIN EN 60749 covers the I-test and the overvoltage latch-up testing of integrated circuits. This test method is primarily applicable to CMOS devices. Applicability to other technologies must be established.
Notes
DIN EN 60749-29 (2004-07) remains valid alongside this standard until 2014-05-12.
Technical characteristics
| Publisher | Deutsche Institut für Normung e.V. (DIN) |
| Publication Date | 01/01/2012 |
| Page Count | 27 |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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