Superseded
Standard
Historical
DIN EN 60749-3:2003-04
Semiconductor devices - Mechanical and climatic test methods - Part 3: External visual inspection (IEC 60749-3:2002); German version EN 60749-3:2002.
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Summary
The pupose of this part of DIN EN 60749 is to verify that the materials, design, construction, markings and wrokmanship of a semiconductor device are in accordance with applicable procurement document. External visual inspection is a non-destructive test and applicable for all package types. The test is useful for qualification, process-monitor, or lot acceptance, or both.
Notes
Under certain conditions, DIN EN 60749 (2002-09) remains valid alongside this standard until 2005-07-01.*A transition period, as set out in DIN EN 60749-3 (2018-01), exists until 2020-04-07.
Technical characteristics
| Publisher | Deutsche Institut für Normung e.V. (DIN) |
| Publication Date | 04/01/2003 |
| Cancellation Date | 01/01/2018 |
| Page Count | 5 |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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