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DIN EN 60749-3:2018-01
Semiconductor devices - Mechanical and climatic test methods - Part 3: External visual examination (IEC 60749-3:2017); German version EN 60749-3:2017.
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Summary
This part of DIN EN 60749 is to verify by an visual inspection that the materials, design, construction, markings, and workmanship of a semiconductor device are in accordance with the applicable procurement document.
Notes
DIN EN 60749-3 (2003-04) remains valid alongside this standard until 2020-04-07.
Technical characteristics
| Publisher | Deutsche Institut für Normung e.V. (DIN) |
| Publication Date | 01/01/2018 |
| Page Count | 14 |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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