Superseded
Standard
Historical
DIN EN 60749-5:2003-09
Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test (IEC 60749-5:2003); German version EN 60749-5:2003.
Preview
Summary
This part of DIN EN 60749 provides a steady-state temperature and humidity bias life test for the purpose of evaluating the reliability of non-hermetic packaged solid-state devices in humid environments.
Notes
Under certain conditions, DIN EN 60749 (2002-09) remains valid alongside this standard until 2006-03-01.*A transition period, as set out in DIN EN 60749-5 (2018-01), exists until 2020-05-15.
Technical characteristics
| Publisher | Deutsche Institut für Normung e.V. (DIN) |
| Publication Date | 09/01/2003 |
| Cancellation Date | 01/01/2018 |
| Page Count | 10 |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
No products.
Previous versions
