Superseded
Draft standard
Historical
DIN EN 60749-5:2016-12
Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test (IEC 47/2311/CDV:2016); German version prEN 60749-5:2016
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Summary
This part of IEC 60749 provides a steady-state temperature and humidity bias life test for the purpose of evaluating the reliability of non-hermetic packaged solid-state devices in humid environments. This test method is considered destructive.
Notes
Prévu pour remplacer DIN EN 60749-5 (2003-09).
Technical characteristics
| Publisher | Deutsche Institut für Normung e.V. (DIN) |
| Publication Date | 12/01/2016 |
| Cancellation Date | 01/01/2018 |
| Page Count | 15 |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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