31.080.01 : Semiconductor devices in general

IEC 60747-5-4:2006

IEC 60747-5-4:2006

Superseded Historical

IEC 60747-5-4:2006 Semiconductor devices - Discrete devices - Part 5-4: Optoelectronic devices - Semiconductor lasers

€244.00

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IEC 60191-2:1966/AMD12:2006

IEC 60191-2:1966/AMD12:2006

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IEC 60191-2:1966/AMD12:2006 Amendment 12 - Mechanical standardization of semiconductor devices - Part 2: Dimensions

€23.00

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IEC 60191-2:1966/AMD13:2006

IEC 60191-2:1966/AMD13:2006

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IEC 60191-2:1966/AMD13:2006 Amendment 13 - Mechanical standardization of semiconductor devices - Part 2: Dimensions

€93.00

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IEC 60191-2:1966/AMD14:2006

IEC 60191-2:1966/AMD14:2006

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IEC 60191-2:1966/AMD14:2006 Amendment 14 - Mechanical standardization of semiconductor devices - Part 2: Dimensions

€46.00

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IEC 60191-2:1966/AMD15:2006

IEC 60191-2:1966/AMD15:2006

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IEC 60191-2:1966/AMD15:2006 Amendment 15 - Mechanical standardization of semiconductor devices - Part 2: Dimensions

€23.00

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IEC 60749-35:2006

IEC 60749-35:2006

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IEC 60749-35:2006 Semiconductor devices - Mechanical and climatic test methods - Part 35: Acoustic microscopy for plastic encapsulated electronic components

€186.00

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IEC 60749-27:2006

IEC 60749-27:2006

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IEC 60749-27:2006 Semiconductor devices - Mechanical and climatic test methods - Part 27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM)

€93.00

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IEC 60749-39:2006

IEC 60749-39:2006

Superseded Historical

IEC 60749-39:2006 Semiconductor devices - Mechanical and climatic test methods - Part 39: Measurement of moisture diffusivity and water solubility in organic materials used for semiconductor components

€46.00

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IEC 60191-2:1966/AMD16:2007

IEC 60191-2:1966/AMD16:2007

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IEC 60191-2:1966/AMD16:2007 Amendment 16 - Mechanical standardization of semiconductor devices - Part 2: Dimensions

€23.00

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IEC 60747-9:2007

IEC 60747-9:2007

Superseded Historical

IEC 60747-9:2007 Semiconductor devices - Discrete devices - Part 9: Insulated-gate bipolar transistors (IGBTs)

€389.00

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IEC 60747-5-5:2007

IEC 60747-5-5:2007

Superseded Historical

IEC 60747-5-5:2007 Semiconductor devices - Discrete devices - Part 5-5: Optoelectronic devices - Photocouplers

€389.00

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IEC 60749-37:2008

IEC 60749-37:2008

Superseded Historical

IEC 60749-37:2008 Semiconductor devices - Mechanical and climatic test methods - Part 37: Board level drop test method using an accelerometer

€133.00

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IEC 60749-38:2008

IEC 60749-38:2008

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IEC 60749-38:2008 Semiconductor devices - Mechanical and climatic test methods - Part 38: Soft error test method for semiconductor devices with memory

€93.00

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IEC 60191-2:1966/AMD17:2008

IEC 60191-2:1966/AMD17:2008

Active Most Recent

IEC 60191-2:1966/AMD17:2008 Amendment 17 - Mechanical standardization of semiconductor devices - Part 2: Dimensions

€23.00

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IEC 60749-20:2008

IEC 60749-20:2008

Superseded Historical

IEC 60749-20:2008 Semiconductor devices - Mechanical and climatic test methods - Part 20: Resistance of plastic encapsulated SMDs to the combined effect of moisture and soldering heat

€244.00

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