31.080 : Semiconductor devices

31.080.01

Semiconductor devices in general

31.080.10

Diodes

31.080.20

Thyristors

31.080.30

Transistors

31.080.99

Other semiconductor devices
BS IEC 62047-45:2025

BS IEC 62047-45:2025

Active Most Recent

Semiconductor devices. Micro-electromechanical devices Silicon based MEMS fabrication technology. Measurement method of impact resistance nanostructures

€193.00

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BS IEC 60747-6:2016

BS IEC 60747-6:2016

Withdrawn Most Recent

Semiconductor devices Discrete devices. Thyristors

€404.00

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BS IEC 60747-2:2016

BS IEC 60747-2:2016

Withdrawn Most Recent

Semiconductor devices Discrete devices. Rectifier diodes

€355.00

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BS EN 60747-15:2012

BS EN 60747-15:2012

Withdrawn Most Recent

Semiconductor devices. Discrete devices Isolated power semiconductor

€269.00

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25/30544412 DC:2025

25/30544412 DC:2025

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Draft BS EN 60747-5-17 Semiconductor devices Part 5-17: Optoelectronic - Light emitting diode Measuring methods of optoelectronic parameters micro scale light array

€23.00

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BS IEC 63150-2:2025

BS IEC 63150-2:2025

Active Most Recent

Semiconductor devices. Measurement and evaluation methods of kinetic energy harvesting devices under practical vibration environment Human arm swing motion

€269.00

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BS IEC 63150-3:2025

BS IEC 63150-3:2025

Active Most Recent

Semiconductor devices. Measurement and evaluation methods of kinetic energy harvesting devices under practical vibration environment Human foot impact motion

€269.00

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25/30461045 DC:2025

25/30461045 DC:2025

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Draft BS EN 63464-1 Medical electrical equipment Particular requirements for the basic safety and essential performance of neutron capture therapy

€42.00

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25/30510415 DC:2025

25/30510415 DC:2025

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Draft BS EN 63551-5 Semiconductor devices - Detection modules of autonomous land vehicle Part 5: Testing methods performance for ultrasonic

€23.00

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25/30510419 DC:2025

25/30510419 DC:2025

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Draft BS EN 63551-6 Semiconductor devices - Detection modules of autonomous land vehicle Part 6: Testing methods performance for visual imaging

€23.00

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25/30539990 DC:2025

25/30539990 DC:2025

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Draft BS EN 63364-2 Semiconductor devices - for IoT system Part 2: Test method of semiconductor photon sources incorporating human factors wearable equipment

€23.00

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BS IEC 62047-49:2025

BS IEC 62047-49:2025

Active Most Recent

Semiconductor devices. Micro-electromechanical devices Temperature and humidity test methods for piezoelectric MEMS cantilevers

€165.00

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26/30510433 DC:2026

26/30510433 DC:2026

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Draft BS EN 62047-54 Ed.1.0 Micro-electromechanical devices Part 54: Silicon based MEMS fabrication technology - Test method of microstructure tensile

€23.00

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26/30543279 DC:2025

26/30543279 DC:2025

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BS EN IEC 62047-57 Micro-electromechanical systems Part 57: RF MEMS directional coupler

€23.00

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BS EN IEC 60749-7:2026

BS EN IEC 60749-7:2026

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Semiconductor devices. Mechanical and climatic test methods Internal moisture content measurement the analysis of other residual gases

€193.00

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