Microbeam analysis — Focused ion beam application for TEM specimen preparation — Vocabulary
€23.00
Microbeam analysis. Analytical electron microscopy. Methods for calibrating image magnification by using reference materials with periodic structures
€374.00
BS ISO 25498 Microbeam analysis - Analytical electron microscopy - Selected area electron diffraction analysis using a transmission electron microscope
Microbeam analysis. Analytical electron microscope. Method of determination for apparent growth direction of nanocrystals by transmission electron microscopy
€269.00
Microbeam analysis. Electron probe microanalysis. Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy
Method of measurement of colour in Hazen units (platinum-cobalt scale) of liquid chemical products
€165.00
Microbeam analysis. Analytical electron microscopy. Method for the determination of interface position in the cross-sectional image of the layered materials
Method for the determination of crystallizing point. Method for the determination of melting point and/or melting range
BS ISO 23971 Surface chemical analysis. X-ray fluorescence analysis of particulate matter filters
Surface chemical analysis — X-ray fluorescence analysis of particulate matter filters
€316.00
BS ISO 23699 Microbeam analysis. Electron backscatter diffraction. Vocabulary
Microbeam analysis. Analytical electron microscopy. Selected area electron diffraction analysis using a transmission electron microscope
Microbeam analysis. Focused ion beam application for TEM specimen preparation. Vocabulary
Surface chemical analysis. Glow discharge optical emission spectrometry (GD-OES). Introduction to use
€193.00
Microbeam analysis. Analytical electron microscopy. Selected-area electron diffraction analysis using a transmission electron microscope
