Microbeam analysis — Electron probe microanalysis — Guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry
€77.00
Gas analysis — Comparison methods for the determination of the composition of gas mixtures based on one- and two-point calibration
€155.00
Surface chemical analysis — Auger electron spectroscopy — Derivation of chemical information
Microbeam analysis — Electron probe microanalyser (EPMA) — Guidelines for performing quality assurance procedures
€183.00
Surface chemical analysis — Secondary-ion mass spectrometry — Method for depth profiling of boron in silicon
Surface chemical analysis — X-ray photoelectron spectroscopy — Estimating and reporting detection limits for elements in homogeneous materials
Surface chemical analysis — Characterization of functional glass substrates for biosensing applications
Surface chemical analysis — Electron spectroscopies — Minimum reporting requirements for peak fitting in X-ray photoelectron spectroscopy
Surface chemical analysis — Analysis of zinc- and/or aluminium-based metallic coatings by glow-discharge optical-emission spectrometry
€208.00
Microbeam analysis — Electron probe microanalysis — Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy
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Surface chemical analysis — Auger electron spectroscopy and X-ray photoelectron spectroscopy — Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials
Surface chemical analysis — Total reflection X-ray fluorescence analysis of water
Surface chemical analysis — Scanning-probe microscopy — Determination of geometric quantities using SPM: Calibration of measuring systems
€235.00
Surface chemical analysis — Secondary ion mass spectrometry — Correction method for saturated intensity in single ion counting dynamic secondary ion mass spectrometry
€115.00
Microbeam analysis — Methods of specimen preparation for analysis of general powders using WDS and EDS
