Surface chemical analysis — Secondary ion mass spectrometry — Method for the measurement of mass resolution in SIMS
€115.00
Surface chemical analysis — X-ray photoelectron spectroscopy — Guidelines for analysis
€183.00
Microbeam analysis — Electron backscatter diffraction — Measurement of average grain size
€155.00
Surface chemical analysis — Measurement of lateral and axial resolutions of a Raman microscope
€77.00
Surface chemical analysis — Depth profiling — Non-destructive depth profiling of nanoscale heavy metal oxide thin films on Si substrates with medium energy ion scattering
Surface chemical analysis — Auger electron spectroscopy and X-ray photoelectron spectroscopy — Methods used to determine peak intensities and information required when reporting results
Surface chemical analysis — X-ray photoelectron spectroscopy — Measurement of silicon oxide thickness
Surface chemical analysis — X-ray photoelectron spectroscopy — Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
Surface chemical analysis — Characterization of nanostructured materials
€208.00
Surface chemical analysis — X-ray photoelectron spectroscopy — Procedures for determining backgrounds
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Surface chemical analysis — Analysis of metal oxide films by glow-discharge optical-emission spectrometry
Laboratory glassware — Borosilicate glass tubing
Microbeam analysis — Analytical electron microscopy — Method for the determination of energy resolution for electron energy loss spectrum analysis
Evaluation of thickness, density and interface width of thin films by X-ray reflectometry — Instrumental requirements, alignment and positioning, data collection, data analysis and reporting
Surface chemical analysis — scanning probe microscopy — Guideline for experimental quantification of carrier concentration in semiconductor devices by using electric scanning probe microscopy
