Gas analysis — General quality aspects and metrological traceability of calibration gas mixtures
€155.00
Surface chemical analysis — Scanning probe microscopy — Procedure for the determination of elastic moduli for compliant materials using atomic force microscope and the two-point JKR method
€115.00
Microbeam analysis — Electron probe microanalysis — Quantitative point analysis for bulk specimens using wavelength dispersive X-ray spectroscopy
Microbeam analysis — Analytical electron microscopy — Selected area electron diffraction analysis using a transmission electron microscope
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Surface chemical analysis — Glow discharge mass spectrometry — Operating procedures
Gas analysis — Handling of calibration gases and gas mixtures — Guidelines
Interoperability of microfluidic devices — Guidelines for pitch spacing dimensions and initial device classification
Surface chemical analysis — Medium-resolution Auger electron spectrometers — Calibration of energy scales for elemental analysis
Surface chemical analysis — Auger electron spectroscopy — Description of selected instrumental performance parameters
€51.00
Surface chemical analysis — X-ray photoelectron spectroscopy — Description of selected instrumental performance parameters
Gas analysis — Purity analysis and the treatment of purity data
Surface chemical analysis — Secondary ion mass spectrometry — Calibration of the mass scale for a time-of-flight secondary ion mass spectrometer
Surface chemical analysis — Secondary ion mass spectrometry — Method for determining yield volume in argon cluster sputter depth profiling of organic materials
€183.00
Surface chemical analysis — Near real-time information from the X-ray photoelectron spectroscopy survey scan — Rules for identification of, and correction for, surface contamination by carbon-containing compounds
Microfluidic devices — Interoperability requirements for dimensions, connections and initial device classification
