Microbeam analysis — Electron probe microanalysis — Quantitative analysis of Mn dendritic segregation in continuously cast steel product
€115.00
Microbeam analysis — Guidelines for misorientation analysis to assess mechanical damage of austenitic stainless steel by electron backscatter diffraction (EBSD)
€155.00
Microbeam analysis — Electron backscatter diffraction — Quantitative determination of austenite in steel
Liquid chromatography at critical conditions (LCCC) — Chemical heterogeneity of polyethylene oxides
€208.00
Surface chemical analysis — Depth profiling — Methods for ion beam alignment and the associated measurement of current or current density for depth profiling in AES and XPS
Microbeam analysis — EMSA/MAS standard file format for spectral-data exchange
€77.00
Microbeam analysis — Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers (EDS) for use with a scanning electron microscope (SEM) or an electron probe microanalyser (EPMA)
Surface chemical analysis — Analysis of metallic nanolayers on iron based substrates by glow-discharge optical-emission spectrometry
€183.00
Surface chemical analysis — Determination of the minimum detectability of surface plasmon resonance device
Microbeam analysis — Analytical electron microscopy — Calibration procedure of energy scale for elemental analysis by electron energy loss spectroscopy
Microbeam analysis — Electron probe microanalysis — Methods for elemental-mapping analysis using wavelength-dispersive spectroscopy
Surface chemical analysis — Secondary-ion mass spectrometry — Method for depth profiling of arsenic in silicon
Microbeam analysis — Electron backscatter diffraction — Measurement of average grain size
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Microbeam analysis — Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers for use in electron probe microanalysis
Surface chemical analysis — Scanning probe microscopy — Standards on the definition and calibration of spatial resolution of electrical scanning probe microscopes (ESPMs) such as SSRM and SCM for 2D-dopant imaging and other purposes
